![]() Optical secondary eclipse measurements of small planets can provide a wealth of information about the reflective properties of these worlds, but the measurements are particularly challenging to attain because of their relatively shallow depth. Observatoire Astronomique de l’Université de Genève,ĭepartamento de Astronomía, Universidad de Chile,Ĭontext. Jet Propulsion Laboratory, California Institute of Technology, Las Campanas Observatory, Carnegie Institution of Washington, Colina El Pino,ĭepartment of Physics and Astronomy, University of Kansas,ĭepartment of Physics and Astronomy, The University of New Mexico, INAF, Osservatorio Astrofisico di Catania,Ĭentre for Exoplanet Science, SUPA School of Physics and Astronomy, University of St Andrews, Université Côte d’Azur, Observatoire de la Côte d’Azur, CNRS, Vinés 12Į-mail: de Estudios Astrofísicos, Facultad de Ingeniería y Ciencias, Universidad Diego Portales,Ĭentro de Astrofísica y Tecnologías Afines (CATA),
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